Influence of laser excitation on raman and photoluminescence spectra and FTIR study of porous silicon layers
A porous silicon lm (PS) was investigated by FTIR, Raman and photoluminescence (PL) spectroscopies. The Raman and PL spectra were obtained using four different laser excitations: 488, 514, 633 and 782 nm. The analysis of the first order and second order Raman scattering lines permits to identify the...
| Main Authors: | Salcedo, Walter Jaimes, Ramirez Fernandez, Francisco J., Rubimc, Joel C. |
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| Format: | Artigo |
| Language: | English |
| Published: |
Sociedade Brasileira de Física
2017
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| Online Access: |
http://repositorio.unb.br/handle/10482/25549 |
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