Reliability engineering for electronic systems
Main Author: | Myers, R.H. |
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Other Authors: | Wong, K.L. |
Published: |
New York : John Wiley & Sons,
1964
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Subjects: | |
Online Access: |
https://consultaredebie.decex.eb.mil.br/pergamum/biblioteca/index.php?codAcervo=416092 |
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ir-perga-oai-4160922019-03-07T15:13:09Z Reliability engineering for electronic systems Myers, R.H. Engenharia eletrônica New York : John Wiley & Sons, Wong, K.L. 1964. https://consultaredebie.decex.eb.mil.br/pergamum/biblioteca/index.php?codAcervo=416092 |
institution |
REDEBIE |
collection |
REDEBIE |
topic |
Engenharia eletrônica |
spellingShingle |
Engenharia eletrônica Myers, R.H. Reliability engineering for electronic systems |
author2 |
Wong, K.L. |
author |
Myers, R.H. |
author_sort |
Myers, R.H. |
title |
Reliability engineering for electronic systems |
title_short |
Reliability engineering for electronic systems |
title_full |
Reliability engineering for electronic systems |
title_fullStr |
Reliability engineering for electronic systems |
title_full_unstemmed |
Reliability engineering for electronic systems |
title_sort |
reliability engineering for electronic systems |
publisher |
New York : John Wiley & Sons, |
publishDate |
1964 |
url |
https://consultaredebie.decex.eb.mil.br/pergamum/biblioteca/index.php?codAcervo=416092 |
_version_ |
1641978057894920192 |
score |
13.657419 |