Reliability of nanoscale circuits and systems : methodologies and circuit architectures / Milos Stanisavljevic, Alexandre Schmid, Yusuf Leblebici

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Main Author: Stanisavljevic, Milos
Format: Online
Published: New York : Springer, 2011
Online Access: https://consultaredebie.decex.eb.mil.br/pergamum/biblioteca/index.php?codAcervo=419870
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