Extreme statistics in nanoscale memory design / editores Amith Singhee, Rob A.Rutenbar
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| Format: | Online |
|---|---|
| Published: |
New York : Springer,
2010
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https://consultaredebie.decex.eb.mil.br/pergamum/biblioteca/index.php?codAcervo=419946 |
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ir-perga-oai-4199462019-03-07T15:13:09Z Extreme statistics in nanoscale memory design / editores Amith Singhee, Rob A.Rutenbar 621.395 22 Circuitos VLSI Semicondutores Memória Inclui bibliografia e índice New York : Springer, Singhee, Amith Rutenbar, Rob A. 2010. https://consultaredebie.decex.eb.mil.br/pergamum/biblioteca/index.php?codAcervo=419946 |
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Online |
| title |
Extreme statistics in nanoscale memory design / editores Amith Singhee, Rob A.Rutenbar |
| spellingShingle |
Extreme statistics in nanoscale memory design / editores Amith Singhee, Rob A.Rutenbar |
| title_short |
Extreme statistics in nanoscale memory design / editores Amith Singhee, Rob A.Rutenbar |
| title_full |
Extreme statistics in nanoscale memory design / editores Amith Singhee, Rob A.Rutenbar |
| title_fullStr |
Extreme statistics in nanoscale memory design / editores Amith Singhee, Rob A.Rutenbar |
| title_full_unstemmed |
Extreme statistics in nanoscale memory design / editores Amith Singhee, Rob A.Rutenbar |
| title_sort |
extreme statistics in nanoscale memory design / editores amith singhee, rob a.rutenbar |
| description |
Inclui bibliografia e índice |
| publisher |
New York : Springer, |
| publishDate |
2010 |
| url |
https://consultaredebie.decex.eb.mil.br/pergamum/biblioteca/index.php?codAcervo=419946 |
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1689972633675759616 |
| score |
13.657419 |