Measurement of the oxygen and impurity distribution in polycrystalline aluminum nitride with secondary ion mass spectrometry Gregg e. potter ... [et al.]

Presented in part at the 92nd Annual Meeting of the American Ceramic Society, Dallas, April 23, 1990 (Symposium on Substrates for Electronics).

Main Author: -
Other Authors: Potter, Gregg E
Format: Livro
Language: ngs
Published: 2018
Subjects:
Online Access: http://www.redebim.dphdm.mar.mil.br/pergamum/biblioteca/index.php?codAcervo=55078
http://repositorio.mar.mil.br/handle/ripcmb/637795
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