Yield and reliability in microwave circuit and system design/Michael D. Meehan and John Purviance.-
Inclui índice. Referências bibliográficas ao final dos capítulos
| Main Author: | Meehan, Michael D |
|---|---|
| Other Authors: | Purviance, John |
| Format: | Livro |
| Language: | eng |
| Published: |
Boston:Artech House,
2018
|
| Subjects: | |
| Online Access: |
http://www.redebim.dphdm.mar.mil.br/pergamum/biblioteca/index.php?codAcervo=53445 http://repositorio.mar.mil.br/handle/ripcmb/751170 |
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