High-yield assembly of multichip modules through known-good ic's and effective test strategies John k. hagge and russell j. wagner
Bibliografia : p. 1990-1994
| Main Author: | Hagge, John K |
|---|---|
| Other Authors: | Wagner, Russell J |
| Format: | Livro |
| Language: | ngs |
| Published: |
2018
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| Subjects: | |
| Online Access: |
http://www.redebim.dphdm.mar.mil.br/pergamum/biblioteca/index.php?codAcervo=55140 http://repositorio.mar.mil.br/handle/ripcmb/604642 |
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