High-yield assembly of multichip modules through known-good ic's and effective test strategies John k. hagge and russell j. wagner
Bibliografia : p. 1990-1994
Main Author: | Hagge, John K |
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Other Authors: | Wagner, Russell J |
Format: | Livro |
Language: | ngs |
Published: |
2018
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Online Access: |
http://www.redebim.dphdm.mar.mil.br/pergamum/biblioteca/index.php?codAcervo=55140 http://repositorio.mar.mil.br/handle/ripcmb/604642 |
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oai:localhost:ripcmb-6046422018-07-17T14:15:01Z High-yield assembly of multichip modules through known-good ic's and effective test strategies John k. hagge and russell j. wagner Hagge, John K Wagner, Russell J Pacote eletronico Circuitos integrados Bibliografia : p. 1990-1994 2018-07-17T14:15:01Z 2018-07-17T14:15:01Z 2018 Livro http://www.redebim.dphdm.mar.mil.br/pergamum/biblioteca/index.php?codAcervo=55140 http://repositorio.mar.mil.br/handle/ripcmb/604642 ngs Acesso livre |
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REPOSITORIO MARINHA |
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REPOSITORIO MARINHA |
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Pacote eletronico Circuitos integrados |
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Pacote eletronico Circuitos integrados Hagge, John K High-yield assembly of multichip modules through known-good ic's and effective test strategies John k. hagge and russell j. wagner |
description |
Bibliografia : p. 1990-1994 |
author2 |
Wagner, Russell J |
format |
Livro |
author |
Hagge, John K |
author_sort |
Hagge, John K |
title |
High-yield assembly of multichip modules through known-good ic's and effective test strategies John k. hagge and russell j. wagner |
title_short |
High-yield assembly of multichip modules through known-good ic's and effective test strategies John k. hagge and russell j. wagner |
title_full |
High-yield assembly of multichip modules through known-good ic's and effective test strategies John k. hagge and russell j. wagner |
title_fullStr |
High-yield assembly of multichip modules through known-good ic's and effective test strategies John k. hagge and russell j. wagner |
title_full_unstemmed |
High-yield assembly of multichip modules through known-good ic's and effective test strategies John k. hagge and russell j. wagner |
title_sort |
high-yield assembly of multichip modules through known-good ic's and effective test strategies john k. hagge and russell j. wagner |
publishDate |
2018 |
url |
http://www.redebim.dphdm.mar.mil.br/pergamum/biblioteca/index.php?codAcervo=55140 http://repositorio.mar.mil.br/handle/ripcmb/604642 |
_version_ |
1642315611851718656 |
score |
13.657419 |