High-yield assembly of multichip modules through known-good ic's and effective test strategies John k. hagge and russell j. wagner

Bibliografia : p. 1990-1994

Main Author: Hagge, John K
Other Authors: Wagner, Russell J
Format: Livro
Language: ngs
Published: 2018
Subjects:
Online Access: http://www.redebim.dphdm.mar.mil.br/pergamum/biblioteca/index.php?codAcervo=55140
http://repositorio.mar.mil.br/handle/ripcmb/604642
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spelling oai:localhost:ripcmb-6046422018-07-17T14:15:01Z High-yield assembly of multichip modules through known-good ic's and effective test strategies John k. hagge and russell j. wagner Hagge, John K Wagner, Russell J Pacote eletronico Circuitos integrados Bibliografia : p. 1990-1994 2018-07-17T14:15:01Z 2018-07-17T14:15:01Z 2018 Livro http://www.redebim.dphdm.mar.mil.br/pergamum/biblioteca/index.php?codAcervo=55140 http://repositorio.mar.mil.br/handle/ripcmb/604642 ngs Acesso livre
institution REPOSITORIO MARINHA
collection REPOSITORIO MARINHA
language ngs
topic Pacote eletronico
Circuitos integrados
spellingShingle Pacote eletronico
Circuitos integrados
Hagge, John K
High-yield assembly of multichip modules through known-good ic's and effective test strategies John k. hagge and russell j. wagner
description Bibliografia : p. 1990-1994
author2 Wagner, Russell J
format Livro
author Hagge, John K
author_sort Hagge, John K
title High-yield assembly of multichip modules through known-good ic's and effective test strategies John k. hagge and russell j. wagner
title_short High-yield assembly of multichip modules through known-good ic's and effective test strategies John k. hagge and russell j. wagner
title_full High-yield assembly of multichip modules through known-good ic's and effective test strategies John k. hagge and russell j. wagner
title_fullStr High-yield assembly of multichip modules through known-good ic's and effective test strategies John k. hagge and russell j. wagner
title_full_unstemmed High-yield assembly of multichip modules through known-good ic's and effective test strategies John k. hagge and russell j. wagner
title_sort high-yield assembly of multichip modules through known-good ic's and effective test strategies john k. hagge and russell j. wagner
publishDate 2018
url http://www.redebim.dphdm.mar.mil.br/pergamum/biblioteca/index.php?codAcervo=55140
http://repositorio.mar.mil.br/handle/ripcmb/604642
_version_ 1642315611851718656
score 13.657419