Neutron reflectometry characterization of interface width between sol-gel titanium dioxide and silicon dioxide thin films Joseph l. keddie ... [et al.]

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Main Author: -
Other Authors: Keddie, Joseph L
Format: Livro
Language: ngs
Published: 2018
Subjects:
Online Access: http://www.redebim.dphdm.mar.mil.br/pergamum/biblioteca/index.php?codAcervo=53579
http://repositorio.mar.mil.br/handle/ripcmb/650977
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