Neutron reflectometry characterization of interface width between sol-gel titanium dioxide and silicon dioxide thin films Joseph l. keddie ... [et al.]

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Other Authors: Keddie, Joseph L
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Published: 2018
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Online Access: http://www.redebim.dphdm.mar.mil.br/pergamum/biblioteca/index.php?codAcervo=53579
http://repositorio.mar.mil.br/handle/ripcmb/650977
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spelling oai:localhost:ripcmb-6509772018-07-17T15:12:55Z Neutron reflectometry characterization of interface width between sol-gel titanium dioxide and silicon dioxide thin films Joseph l. keddie ... [et al.] - Keddie, Joseph L Filmes finos Superficies (tecnologia) Inclui bibliografia 2018-07-17T15:12:55Z 2018-07-17T15:12:55Z 2018 Livro http://www.redebim.dphdm.mar.mil.br/pergamum/biblioteca/index.php?codAcervo=53579 http://repositorio.mar.mil.br/handle/ripcmb/650977 ngs Acesso livre
institution REPOSITORIO MARINHA
collection REPOSITORIO MARINHA
language ngs
topic Filmes finos
Superficies (tecnologia)
spellingShingle Filmes finos
Superficies (tecnologia)
-
Neutron reflectometry characterization of interface width between sol-gel titanium dioxide and silicon dioxide thin films Joseph l. keddie ... [et al.]
description Inclui bibliografia
author2 Keddie, Joseph L
format Livro
author -
author_sort -
title Neutron reflectometry characterization of interface width between sol-gel titanium dioxide and silicon dioxide thin films Joseph l. keddie ... [et al.]
title_short Neutron reflectometry characterization of interface width between sol-gel titanium dioxide and silicon dioxide thin films Joseph l. keddie ... [et al.]
title_full Neutron reflectometry characterization of interface width between sol-gel titanium dioxide and silicon dioxide thin films Joseph l. keddie ... [et al.]
title_fullStr Neutron reflectometry characterization of interface width between sol-gel titanium dioxide and silicon dioxide thin films Joseph l. keddie ... [et al.]
title_full_unstemmed Neutron reflectometry characterization of interface width between sol-gel titanium dioxide and silicon dioxide thin films Joseph l. keddie ... [et al.]
title_sort neutron reflectometry characterization of interface width between sol-gel titanium dioxide and silicon dioxide thin films joseph l. keddie ... [et al.]
publishDate 2018
url http://www.redebim.dphdm.mar.mil.br/pergamum/biblioteca/index.php?codAcervo=53579
http://repositorio.mar.mil.br/handle/ripcmb/650977
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score 13.657419